P. T. Liu,
C. H. Chang, and C. S. Fuh, Enhancement of reliability and stability for transparent amorphous indium-zinc-tin-oxide thin film transistors.
Royal society of chemistry,
2016, 6, 106374-106379.
P. T. Liu*,
C. H. Chang, C. S. Fuh, Y. T. Liao, S. M. Sze, “Effects of Nitrogen on Amorphous Nitrogenated InGaZnO (a-IGZO:N) Thin Film Transistors,”
Journal of Display Technology,
2016, 12(10), 1070-1077.
P. T. Liu, C. H. Chang, and C. S. Fuh (2016, NOV). Enhancement of reliability and stability for transparent amorphous indium-zinc-tin-oxide thin film transistors. Royal society of chemistry, 2016, 6, 106374-106379.
P. T. Liu,
C. H. Chang, and C. S. Fuh, Enhancement of reliability and stability for transparent amorphous indium-zinc-tin-oxide thin film transistors.
Royal society of chemistry,
2016, 6, 106374-106379.
P. T. Liu,
C. H. Chang, and C. S. Fuh, Enhancement of reliability and stability for transparent amorphous indium-zinc-tin-oxide thin film transistors.
Royal society of chemistry,
2016, 6, 106374-106379.